Event Date: 05-03-2018, 13:00
Event Location: FORTH/ICE-HT Auditorium (Seminar Room)
Focused Ion beam (FIB) as a Fabrication-Analysis-Microscopic (FAM) tool
SEMINARS
Speaker: Yafit Fleger, Head of the Charge Particle Microscope (CPM)
Bar Ilan Institute of Nanotechnology & Advanced Materials
Ramat Gan, Israel
Invited by: Prof. Sophia Antimisiaris
Theme: Focused Ion beam (FIB) as a Fabrication-Analysis-Microscopic (FAM) tool
Date: Monday, March 5th, 2018
Place: FORTH/ICE-HT Auditorium
Time: 13:00 h.
Location Information
FORTH/ICE-HT Auditorium (Seminar Room)
Stadiou 1 Str., Platani, GR-26504 Patras, Hellas
Organizer
FORTH/ICE-HT
Stadiou Str., Platani
www.iceht.forth.gr
Event starts: 05-03-2018, 13:00