Event Date: 05-03-2018, 13:00
Event Location: FORTH / ICE - HT Auditorium

Focused Ion beam (FIB) as a Fabrication-Analysis-Microscopic (FAM) tool

Category: SEMINARS

Speaker: Yafit Fleger, Head of the Charge Particle Microscope (CPM)
Bar Ilan Institute of Nanotechnology & Advanced Materials
Ramat Gan, Israel
Invited by: Prof. Sophia Antimisiaris
Theme: Focused Ion beam (FIB) as a Fabrication-Analysis-Microscopic (FAM) tool
Date: Monday, March 5th, 2018
Place: FORTH/ICE-HT Auditorium
Time: 13:00 h.

Location Information

FORTH / ICE - HT Auditorium

Stadiou 1 Str., Platani, GR-26504 Patras, Hellas

Patras,Greece

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Organizer

FORTH / ICE - HT

Stadiou Str., Platani

www.iceht.forth.gr

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Event starts: 05-03-2018, 13:00
Event ends: 05-03-2018, 23:50