Journal Publications

Found: 1627 publications in scientific journals

Year: All

Research fields categories

When you hear the following letters, it means the information is related to a specific research field, as follows:

N is for Nanotechnology / Advanced materials
E is for Energy / Environment
B is for Biosciences / Biotechnology
A is for All research fields

pH responsive heteroarm starlike micelles from double hydrophilic ABC terpolymer with ampholitic A and C blocks

Sfika; V; Tsitsilianis; C; Kiriy; A; Gorodyska; G; Stamm; M Journal: MACROMOLECULES Year: 2004 Volume: 37 Issue: 25 Pages: 9551-9560
DΟΙ: https://doi.org/10.1021/ma048621q

N

Vanadia-silica and vanadia-cesium-silica catalysts for oxidation of SO2

Parvulescu; VI; Paun; C; Parvulescu; V; Alifanti; M; Giakoumelou; I; Boghosian; S; Rasmussen; SB; Eriksen; KM; Fehrmann; R Journal: JOURNAL OF CATALYSIS Year: 2004 Volume: 225 Issue: 1 Pages: 24-36
DΟΙ: https://doi.org/10.1016/j.jcat.2004.03.040

N

Effect of the chain length on the photonic efficiency of aromatic-aliphatic dendronized polyethers

Pistolis; G; Andreopoulou; AK; Malliaris; A; Kallitsis; JK Journal: MACROMOLECULES Year: 2004 Volume: 37 Issue: 4 Pages: 1524-1530
DΟΙ: https://doi.org/10.1021/ma035568h

N

Crystal structure and spectroscopic properties of CsVO2SO4

Rasmussen; SB; Boghosian; S; Nielsen; K; Eriksen; KM; Fehrmann; R Journal: INORGANIC CHEMISTRY Year: 2004 Volume: 43 Issue: 12 Pages: 3697-3701
DΟΙ: https://doi.org/10.1021/ic030314y

N

The electronic structure of the sputtered indium-tin oxide and a thin conjugated oligomer film interface

Papaefthimiou; V; Kennou; S Journal: SURFACE SCIENCE Year: 2004 Volume: 566 Pages: 497-501
DΟΙ: https://doi.org/10.1016/j.susc.2004.05.102

N

The electronic properties of the interface between a thin conjugated oligomer film and SiO2/Si(111)- studied by photoemission spectroscopies

Papaefthimiou; V; Siokou; A; Kennou; S Journal: THIN SOLID FILMS Year: 2004 Volume: 459 Issue: 43862 Pages: 32-36
DΟΙ: https://doi.org/10.1016/j.tsf.2003.12.089

N

A photoemission study of the Ooct-OPV5/SiO2/Si(111) interface: Effect of the SiO2 interlayer thickness

Papaefthimiou; V; Siokou; A; Kennou; S Journal: SURFACE SCIENCE Year: 2004 Volume: 569 Issue: 43891 Pages: 207-218
DΟΙ: https://doi.org/10.1016/j.susc.2004.07.038

N