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The electronic properties of the interface between a thin conjugated oligomer film and SiO2/Si(111)- studied by photoemission spectroscopies

Papaefthimiou; V; Siokou; A; Kennou; S

Journal: THIN SOLID FILMS Year: 2004 Volume: 459 Issue: 43862 Pages: 32-36
DΟΙ: https://doi.org/10.1016/j.tsf.2003.12.089
Research Fields: