Publication
A photoemission study of the Ooct-OPV5/SiO2/Si(111) interface: Effect of the SiO2 interlayer thickness
Journal: SURFACE SCIENCE
Year: 2004
Volume: 569
Issue: 43891
Pages: 207-218
https://doi.org/10.1016/j.susc.2004.07.038
https://doi.org/10.1016/j.susc.2004.07.038