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Variation of nitrogen incorporation and bonding configuration of carbon nitride films studied by X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared (FT-IR) spectroscopic ellipsometry

Kennou; S; Logothetidis; S; Sygellou; L; Laskarakis; A; Sotiropoulou; D; Panayiotatos; Y

Journal: DIAMOND AND RELATED MATERIALS Year: 2002 Volume: 11 Issue: 43985 Pages: 1183-1187
DΟΙ: https://doi.org/10.1016/S0925-9635(01)00584-2