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Publication

Thin Film Analysis and Model Interface Characterization Studies of Relevance to Microelectronics

Dontas I.; Papaefthimiou V.; Kennou S.; Ladas S.

Journal: ECS TRANSACTIONS Year: 2007 Volume: 10 Issue: Pages: 65-
DΟΙ: https://doi.org/10.1149/1.2773977

Research Fields:

Nanotechnology / Advanced Materials