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Quantitative depth profile analysis of micrometer-thick multilayered thin coatings using step-scan FT-IR photoacoustic spectroscopy

Gregoriou; VG; Rodman; SE

Journal: ANALYTICAL CHEMISTRY Year: 2002 Volume: 74 Issue: 10 Pages: 2361-2369
DΟΙ: https://doi.org/10.1021/ac011027j