Publication

Measurement of intrinsic and laser heating-induced stress in microcrystalline silicon thin films

Kalampounias; AG; Farsari; E; Amanatides; E; Papatheodorou; GN; Mataras; D


Journal: CHEMICAL PHYSICS Year: 2016 Volume: 469 Issue: Pages: 65-71
DΟΙ: https://doi.org/10.1016/j.chemphys.2016.02.012