Publication

Growth and characterization of the Re/Si(111) interface

Siokou A.; Kennou S.; Ladas S. Nguyen Tan T.A.; Veuillen J.;Y.


Journal: SURFACE SCIENCE Year: 1996 Volume: 352-354 Issue: Pages: 628-633
DΟΙ: https://doi.org/10.1016/0039-6028(95)01217-6