Publication

  • Home
  • Publications
  • Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

Quick Links

View publications by R&D field

Search

Research Project, Scientists etc

Search

Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

Kennou S.; Ladas S.; Paloura E.C.; Kalomiros J.A.

Journal: APPLIED SURFACE SCIENCE Year: 1995 Volume: 90 Issue: Pages: 283-287
DΟΙ: https://doi.org/10.1016/0169-4332(95)00075-5