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Characterization of BaTiO3 thin films on p-Si

Evangelou; EK; Konofaos; N; Aslanoglou; X; Kennou; S; Thomas; CB

Journal: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING Year: 2001 Volume: 4 Issue: 43891 Pages: 305-307
DΟΙ: https://doi.org/10.1016/S1369-8001(00)00109-8