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Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM

Danilatos; G; Rattenberger; J; Dracopoulos; V

Journal: JOURNAL OF MICROSCOPY Year: 2011 Volume: 242 Issue: 2 Pages: 166-180
DΟΙ: https://doi.org/10.1111/j.1365-2818.2010.03455.x
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