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A photoemission study of the Ooct-OPV5/SiO2/Si(111) interface: Effect of the SiO2 interlayer thickness

Papaefthimiou; V; Siokou; A; Kennou; S

Journal: SURFACE SCIENCE Year: 2004 Volume: 569 Issue: 43891 Pages: 207-218
DΟΙ: https://doi.org/10.1016/j.susc.2004.07.038
Research Fields: