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Instrument Characteristics

X-Ray Diffractometer

Bruker D8 Advance
CuKa radiation
Bragg-Brentano geometry
2θ:0-1600
Two detectors one for fast scan and one for films
Parallel beam optics
Knife edge collimators
Soller slits
Diffracted beam monochromator
Thin Film attachment
High temperature furnace
Appropriate software for instrument control and analysis

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X-Ray Diffractometer

Quick Links

X-Ray Diffraction is a well-known technique for the investigation of the structure of crystalline solids and powders. X-rays wavelength is between the ultraviolet and gamma rays in the electromagnetic spectrum, and its magnitude is of the same order of interatomic distances in crystals. Depending on the x-ray wavelength, crystal orientation and structure, a beam of X-rays falling on a crystal undergoes diffraction. The x-ray beam interacts with the electron density of atoms or ions of the crystal lattice, thus producing a specific electron map for the crystalline material investigated. Each crystal has a unique pattern and X-Ray diffraction gives a fingerprint of the studied material. The data collected from the reflections at various angles are analysed according to Bragg' s law. Powder X-ray Diffraction is widely used both for the qualitative analysis of crystalline materials and for the quantitative measurements of crystalline components in composite materials.

 

Services Sample properties
  • Phase identification of bulk and film samples
  • Crystallite size determination
  • Crystallinity percentage
  • Thin film analysis
  • Solid state reactions up to 9000C
Powders, pellets, solids,films
Sample size: 20mm dia
Weight: some mg

 

 

 

Application Form

Contact Person
V. Dracopoulos

 

 
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