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Instrument Characteristics

Atomic Force Microscope (AFM)

Topometrix Explorer

Two dry scanners:

z-scanner 14μm
tube scanner: 2μm

One liquid scanner : 8μm in z-axis

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Atomic Force Microscope (AFM)

Quick Links

Atomic force microscopy (AFM) probes the surface of the sample by monitoring the interaction force between the surface and a sharp tip. This is accomplished by attaching the tip to a cantilever-like spring and detecting its deflection due to the forces acting on the tip. A detector measures the cantilever deflection as the tip is scanned over the surface and a computer generates an image showing the surface morphology. Since interatomic forces are always present when two bodies are close enough, this technique can measure the surface morphology of both conductors and insulators.

 

Services Sample properties
  • 3D surface morphology
  • Contact mode
  • Non-contact mode
  • Tapping mode
  • Liquid imaging
Max height: 10mm

 

 

 

Application Form

Contact Person
V. Dracopoulos

 

 
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